Welcome Note and Introduction

Fabricating the Future: GenAI-Powered Digital Twins

Puja Sahu, Hemlatha Pandey, Sumith Shetty - Western Digital

Break

FAI Accelerators and Custom Hardware for Machine Learning

Rani Bhart, Modassar Rana - IBM

A Unified Cross-Fabric Co-Design Methodology for IC-Package-Board in Advanced Semiconductor Systems

Kirti Sikri, Evneet Bhatia - Cadence

Closing tutorial Session

Welcome Note and Introduction

3D IC Integration & Multi die Verification

Galina Ros, Abraham George - Samsung Electronics

Break

Scan based Volume Logic Diagnosis for Yield Enhancement of Products & Technology qualification

Hina Musafir - ST Microelectronics

Designing Robust DFT Architecture: From Principles to Best Practices

Pavithra K, Pervez Garg - Texas Instruments

Closing tutorial Session